Method of integrating capacitors in semiconductor devices and corresponding device

ABSTRACT

In an embodiment, a semiconductor device includes: a lead-frame including one or more electrically conductive areas, one or more dielectric layers over the electrically conductive area or areas, one or more electrically conductive layer over the one or more dielectric layers thus forming one or more capacitors each including the dielectric layer sandwiched between an electrically conductive area and the electrically conductive layer. The semiconductor device also includes a semiconductor die on the lead-frame electrically connected to the one or more electrically conductive layers.

BACKGROUND Technical Field

The description relates to semiconductor devices.

One or more embodiments may apply to integrating capacitors in semiconductor devices, e.g., in a metal lead-frame of an integrated circuit.

One or more embodiments may apply to integrating capacitors in metal lead-frame packages using Flip Chip technology.

Description of the Related Art

Integrating capacitances (capacitors) in semiconductor devices has been the subject-matter of extensive investigation and experimentation. Integrating a capacitance (capacitor) in a semiconductor device, e.g., in a metal lead-frame of an integrated circuit may involve using various technologies. Exemplary of these are the solution disclosed in US 2003/0011050 A1 (which involves the use of a dedicated two-layer lead-frame) or the solution disclosed in US 2010/0230784 A1 (which exhibits certain limitations in terms of the maximum area of the capacitor electrodes (shields) and the distance between them).

BRIEF SUMMARY

Despite the prior art activity, it would be desirable to provide improved solutions which may be applied to packages such as, e.g., flip chip packages including features such as solder bumps, copper pillars, or so-called stud bumps (including materials such as gold, silver, or copper), possibly using standard lead-frames.

According to one or more embodiments, a method includes:

forming a capacitor, wherein forming the capacitor includes:

-   -   forming a dielectric layer on an electrically conductive area of         a lead-frame,     -   forming an electrically conductive layer on said dielectric         layer, wherein forming the electrically conductive layer         includes sandwiching said dielectric layer between said         electrically conductive area and said electrically conductive         layer, and

arranging a semiconductor die onto said lead-frame and electrically connecting said semiconductor die to said electrically conductive layer.

One or more embodiments may relate to a corresponding semiconductor device, e.g., an integrated circuit.

One or more embodiments are directed to a semiconductor device that includes:

a lead-frame including an electrically conductive area,

a dielectric layer formed on said electrically conductive area,

an electrically conductive layer formed on said dielectric layer, said dielectric layer being sandwiched between said electrically conductive area and said electrically conductive layer, the electrically conductive area, dielectric area, and electrically conductive layer forming a capacitor integrated in the device, and

a semiconductor die arranged onto said lead-frame and electrically connected to said electrically conductive layer.

The claims are an integral part of the technical disclosure of one or more embodiments as provided herein.

One or more embodiments make it possible to integrate a high capacitance value in a semiconductor device without resorting, e.g., to discrete capacitances attached to the lead-frame.

One or more embodiments make it possible to use standard packaging processes, while keeping interconnections between capacitance(s) and device short.

In one or more embodiments, parasitics may be reduced due to bumps providing the main contribution.

One or more embodiments permit to pursue package miniaturization, by making it possible, e.g., to produce semiconductor devices with integrated capacitance(s) having the same size (e.g., single die) of a device without such capacitance(s).

One or more embodiments may be applied to organic- and/or ceramic-based packaging technologies, possibly using a solder mask opening as a cavity with the capability of giving rise to solutions which are more effective than standard organic prepreg materials due to a thin dielectric profile.

One or more embodiments may be applied to a variety of technologies such as Quad-Flat No-Leads (QFN), Quad Flat Package (QFP), Thin Small Outline Package (TSOP).

One or more embodiments may include a dielectric layer produced by a film or jet-printed dielectric material and/or a conductive material layer produced, e.g., by screen printing low temperature sintered composite materials based on microparticles (copper-silver) or jet-print-dispensing nanoparticles (such as copper, silver, carbon) and other conductive materials.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

One or more embodiments will now be described, purely by way of example, with reference to the annexed figures, in which:

FIGS. 1 to 11 are exemplary of various steps in one or more embodiments with FIGS. 2, 4, 6, 8, and 11 representing cross-sectional views along line II-II of FIG. 1, line IV-IV of FIG. 3, line VI-VI of FIG. 5, line VIII-VIII of FIG. 7 and line XI-XI of FIG. 10, respectively,

FIG. 12 is exemplary of dielectric v. conductive layer dimension tolerances in one or more embodiments,

FIG. 13 is exemplary of possible features of one or more embodiments,

FIGS. 14 to 25 are exemplary of further possible embodiments with FIGS. 17, 19, 23 and 25 representing cross-sectional views along line XVII-XVII of FIG. 16, line XIX-XIX of FIG. 18, line XXIII-XXIII of FIG. 22 and line XXV-XXV of FIG. 24, respectively,

FIGS. 26 to 34 are further exemplary of possible features of embodiments with FIGS. 29 and 31 representing cross-sectional views along line XXIX-XXIX of FIG. 28 and line XXXI-XXXI of Figure, respectively.

It will be appreciated that, for the sake of clarity, various figures may not be reproduced to a same scale.

DETAILED DESCRIPTION

In the ensuing description, one or more specific details are illustrated, aimed providing an in-depth understanding of examples of embodiments of this disclosure. The embodiments may be obtained by one or more of the specific details or with other methods, components, materials, and so on. In other cases, known structures, materials or operations are not illustrated or described in detail so that certain aspects of embodiment will not be obscured.

Reference to “an embodiment” or “one embodiment” in the framework of the present description is intended to indicate a particular configuration, structure, characteristic described in relation to the embodiment is compliance in at least one embodiment. Hence, phrases such as “in an embodiment” or “in one (or more) embodiments” that may be present in one or more points in the present description do not necessarily refer to one and the same embodiment. Moreover, particular conformation, structures or characteristics as exemplified in connection with any of the figures may be combined in any other quite way in one or more embodiments as possibly exemplified in other figures.

The references used herein are provided merely for convenience and hence do not define the extent of protection or the scope of the embodiment.

One or more embodiments as exemplified herein may be applied to manufacturing semiconductor devices (e.g., integrated circuits) by resorting, e.g., to Flip-Chip (FC) technology as used, for instance, in producing Quad Flat No-Lead (QFN) integrated circuits.

As schematically represent in FIG. 1, one or more embodiments may involve providing a metal (e.g., copper) lead-frame 10 having, e.g., selectively plated parts 12 provided thereon by known means.

In one or more embodiments (see, e.g., the cross sectional view of FIG. 2) the lead-frame 10 may include a central (possibly recessed or depressed) portion 14, e.g., of quadrilateral/square shape.

In one or more embodiments a recessed portion 14 may be etched (by any standard etching process) to approximately half the thickness of the lead-frame 10, e.g., to a depth of 50 microns (50.10⁻⁶ m).

FIGS. 3 and 4 are exemplary of the formation of a dielectric layer 16 at the portion 14.

In one or more embodiments the dielectric layer 16 may include plural portions separated by gaps therebetween.

In one or more embodiments as exemplified herein, the dielectric layers 16 may include four “lands” arranged in a square matrix-like arrangement and separated by a cross-like pattern of gaps. It will be otherwise appreciated that such arrangement is merely exemplary and not mandatory.

Techniques for producing the dielectric layer 16 may include, e.g., screen printing or jet printing, possibly followed by curing such as UV curing.

An exemplary dielectric material for use in one or more embodiments may include the UV-curable dielectric sold under the trade name of DuPont 5018 by DuPont Microcircuit Materials of Research Triangle Park, N.C., USA. Such material lends itself to being printed with a thickness of 20+/−10 micron (20+/−10×10⁻⁶ m).

Another exemplary dielectric material for use in one or more embodiments may include the jet-printable material sold under the trade name of RAYBRID™ by Toray of Big Beaver Road, Troy, Mich., USA.

Such material can be jet-printed with the thickness of 6+/−2 microns (6+/−2×10⁻⁶ m).

FIGS. 5 and 6 are exemplary of the possible formation of a conductive layer 18 over the dielectric layer(s) 16.

In one or more embodiments, the conductive layer 18 may include a screen-printed conductive layer.

An exemplary conductive material for use in one or more embodiments may include the material sold under the trade name Ormet DAP 689 available with Ormet Circuits, Inc., Nancy Ridge Drive, San Diego Calif., USA.

Such a conductive layer 18 may be screen-printed with a thickness of 25+/−10 microns (25+/−10.10⁻⁶ m).

In one or more embodiments, with the area 14 being recessed, the area 14 may house the dielectric layer 16 and the electrically conductive layer 18.

FIGS. 7 and 8 are exemplary of the possibility of mounting onto the assembly of FIGS. 5 and 6 a semiconductor chip or die 20 provided with electrical contact pads (not visible in the figures) adapted to be electrically connected:

-   -   to the leads in the lead-frame 10, via first electrical         connections 20 a, and     -   to the capacitor(s) formed by the dielectric layer 16 sandwiched         between the lead-frame body 10 (e.g., the bottom surface of the         cavity 14) and the conductive layer(s) 18 via one or more second         electrical connections 20 b.

The connections 20 a, 20 b may be formed by a variety of technologies.

Connection technologies suitable for use in one or more embodiments may include flip chip attach techniques (e.g., Sn/Ag/Cu or SAC bumps), possibly including oven reflow (e.g., at 260° C. peak temperature) to sinter the conductive layer 18 and to reflow the SAC bumps.

FIGS. 9 to 11 are exemplary of a package material 22 such as a package molding compound (PMC) being molded, with any known technology for that purpose onto the assembly shown in FIGS. 7 and 8 to complete the semiconductor device, the process possibly including etching the leadframe 12 at the back surface.

FIG. 12 is a schematic plan view exemplary of possible dimensional dielectric layer 16 v. conductive layer 18 dimension tolerances (expressed in micron units: 1 micron=10⁻⁶ m).

FIG. 12 is also exemplary of the possible provision of an electrical connection 20 b (power or signal capacitance connection).

FIG. 13 is generally exemplary of the extensive degree of freedom in producing the shape and/or surface of the dielectric layer 16 and/or the conductive layer 18 by direct contrast to the exemplary cross-like arrangement shown, e.g., in FIG. 5.

FIGS. 14 to 25 are exemplary of the possibility of applying the concepts exemplified in the foregoing to producing a (e.g., flip chip) capacitor adapted to be connected to an external ground GND through a contact.

For instance, FIG. 14 is exemplary of the possibility of utilizing/configuring one of the leads in the lead-frame 10 (e.g., an enlarged plated pad 120) by forming thereon, e.g., by jet printing, a dielectric layer 126 (FIG. 15) onto which a conductive layer 128 may be formed (FIG. 16), e.g., by screen printing. A possible resulting arrangement is exemplified in the cross-sectional view of FIG. 17.

The same materials previously exemplified in connection with the layers 16 and 18 may be used in producing the dielectric layer 126 and the conductive layer 128 to form a capacitor including the dielectric layer 126 sandwiched between the conductive layer 128 and the pad 120.

FIG. 18 is exemplary of the possibility of mounting onto the assembly of FIG. 17 a semiconductor die 20 which, in addition to a set of connections to a die pad set 200 located inwardly of the lead-frame 10 (not visible in the figures), may include one or more connections 20 b to the conductive layer 128, that is to the capacitor including the dielectric layer 126 sandwiched between the conductive layer 128 and the pad 120 of the lead-frame 10.

The sequence of FIGS. 19 and 20 is exemplary of the possibility of providing the connections 20 b (power or signal capacitance connection) by dipping the bump(s) provided on the die 20 into an un-sintered or un-cured material of the layer 128 (to be subsequently sintered or cured) or by coupling a (smaller) bump in an already sintered or cured material of the conductive layer 128.

Both options exemplified in FIGS. 19 and 20 provide the possibility of controlling the bump “height” (indicated H in FIG. 19).

FIG. 21 is exemplary of the possibility of molding a package molding compound 22 onto the structure thus produced, followed by back etching (FIGS. 22-23) and possible back-sealing with a dielectric jet printing.

As exemplified in the cross-sectional view of FIG. 23, back etching may produce mechanical separation (and thus electrical insulation) between the peripheral portion of the lead-frame including the capacitor pad 120 and the inner portion including the die pad set 200. Back sealing may correspondingly lead to the formation of an insulating dielectric 24 between the two portions: see, e.g., FIG. 25.

FIG. 25 also exemplifies the possibility of connecting to ground GND the capacitor pad 120 so that the capacitor including the dielectric layer 126 sandwiched between the conductive layer 128 and the pad 120 may be connected (via a connection 20 b) between the die 20 and the ground GND.

FIGS. 26 to 34 are exemplary of one or more embodiments wherein the same criteria exemplified in the foregoing may be applied to different types of lead-frame, e.g., a punched or pass-through etched lead-frame 10, possibly arranged over a tape T to contain the molding.

Throughout FIGS. 26 to 34 parts or elements corresponding to parts or elements already discussed in the foregoing are indicated with the same references, thus making it unnecessary to repeat a detailed description herein.

In brief, the sequence of FIGS. 26 and 27 exemplifies the provision (e.g., by screen printing or jet printing, possibly using the same exemplary materials considered in the foregoing) of a dielectric layer 16 over one or more parts 14 (e.g., selectively plated) of a lead-frame 10. Again, the central location of the areas 14 and the possible partition thereof according a cross-like pattern as shown are merely exemplary and not mandatory.

FIG. 28 is exemplary of the possibility of providing (e.g., by screen printing, possibly using for that purpose the same materials exemplified in the foregoing) a conductive layer 18 onto the dielectric layer 16, thus leading to the structure exemplified in FIG. 29.

Such a structure again exhibits a capacitor including a dielectric layer 16 sandwiched between an electrically conductive (e.g., copper) die pad 10 and a similarly electrically conductive layer 18.

FIGS. 30 to 32 are again exemplary of the possibility of mounting onto the structure of FIG. 29 an IC die 20 provided with electrical connections (e.g., bumps) 20 b for electrical contact with the conductive layer 18.

In one or more embodiments, the die 20 may be mounted onto a still un-cured conductive layer 18, e.g., with subsequent surface-mount (SMT) reflow and conductive material sintering performed in one step (“one shot”). Also, the capability of controlling the bump height H as exemplified in FIGS. 19 and 20 will again exist. FIGS. 33 and 34 are exemplary of a package 22 being molded onto the structure of FIGS. 30 to 32 with FIG. 34 exemplary of a possible result of back etching to expose electrically conductive contact areas for the resulting semiconductor device.

Without prejudice to the underlying principles, the details and the embodiments may vary, even significantly, with respect of what has been disclosed by way of example only without departing from of the extent of protection.

The various embodiments described above can be combined to provide further embodiments. These and other changes can be made to the embodiments in light of the above-detailed description. In general, in the following claims, the terms used should not be construed to limit the claims to the specific embodiments disclosed in the specification and the claims, but should be construed to include all possible embodiments along with the full scope of equivalents to which such claims are entitled. Accordingly, the claims are not limited by the disclosure. 

1. A semiconductor device, comprising: a lead-frame including an electrically conductive area, a dielectric layer formed on said electrically conductive area, an electrically conductive layer formed on said dielectric layer, said dielectric layer being sandwiched between said electrically conductive area and said electrically conductive layer, the electrically conductive area, dielectric layer, and electrically conductive layer forming a capacitor integrated in the device, and a semiconductor die arranged onto said lead-frame and electrically connected to said electrically conductive layer.
 2. The semiconductor device of claim 1, further comprising at least one conductive bump in contact with the semiconductor die and the electrically conductive layer.
 3. The semiconductor device of claim 1, wherein said electrically conductive area is a central area of said lead-frame.
 4. The semiconductor device of claim 1, wherein said electrically conductive area is a peripheral area of the lead-frame, the semiconductor device further comprising: electrical insulation between said peripheral area and a central area of said lead-frame.
 5. The semiconductor device of claim 1, wherein said electrically conductive area is a recessed area of said lead-frame, said recessed area housing said dielectric layer and said electrically conductive layer.
 6. The semiconductor device of claim 1, further comprising an electrically insulating layer molded onto said semiconductor die.
 7. The semiconductor device of claim 1, further comprising a plurality of reflowed conductive bumps connecting the electrically conductive layer to the semiconductor die.
 8. The semiconductor device of claim 1, wherein: the electrically conductive area is one of a plurality of electrically conductive areas of the lead frame, the electrically conductive areas being spaced apart from each other; the dielectric layer is one of a plurality of dielectric layers positioned on the electrically conductive areas, respectively; the electrically conductive layer is one of a plurality of electrically conductive layers positioned on the dielectric layer, respectively, the dielectric layers being sandwiched between the electrically conductive areas and the electrically conductive layers, respectively, the electrically conductive areas, dielectric layers, and electrically conductive layers forming a plurality of capacitors; and the semiconductor die is positioned on said lead-frame and is electrically connected to the plurality of electrically conductive layers.
 9. A semiconductor device, comprising: a lead-frame including a top surface, a recessed portion extending below the top surface, and an electrically conductive area defining a bottom of the recessed portion; a dielectric layer formed in the recessed portion and on said electrically conductive area; an electrically conductive layer formed in the recessed portion and on said dielectric layer, said dielectric layer being sandwiched between said electrically conductive area and said electrically conductive layer, the electrically conductive area, dielectric area, and electrically conductive layer forming a capacitor integrated in the device, and a semiconductor die arranged on the top surface of the lead-frame and the electrically conductive layer and electrically connected to said electrically conductive layer.
 10. The semiconductor device of claim 9, further comprising at least one conductive bump in contact with the semiconductor die and the electrically conductive layer.
 11. The semiconductor device of claim 9, wherein said recessed portion is a central area of said lead-frame.
 12. The semiconductor device of claim 9, further comprising an electrically insulating layer molded onto said semiconductor die.
 13. The semiconductor device of claim 9, further comprising a plurality of reflowed conductive bumps connecting the electrically conductive layer to the semiconductor die.
 14. A semiconductor device, comprising: a lead-frame including an electrically conductive peripheral area and an electrically conductive central area spaced apart from the peripheral area; a dielectric layer formed on said peripheral area; an electrically conductive layer formed on said dielectric layer, said dielectric layer being sandwiched between said electrically conductive area and said electrically conductive layer, the electrically conductive area, dielectric layer, and electrically conductive layer forming a capacitor integrated in the device; and a semiconductor die arranged above the central and peripheral areas of said lead-frame and electrically connected to said electrically conductive layer.
 15. The semiconductor device of claim 14, further comprising at least one conductive bump in contact with the semiconductor die and the electrically conductive layer.
 16. The semiconductor device of claim 14, further comprising an electrically insulating layer enveloping said semiconductor die.
 17. The semiconductor device of claim 16, wherein the electrically insulating layer extends into a gap between the central and peripheral areas and electrical insulates the central and peripheral areas from each other.
 18. The semiconductor device of claim 14, further comprising: electrical insulation between said peripheral area and a central area of said lead-frame.
 19. The semiconductor device of claim 14, further comprising a plurality of reflowed conductive bumps connecting the electrically conductive layer to the semiconductor die. 